René Van Grieken received in August 2008 the Birks Award in X-Ray Spectrometry, which is the

most prestigious and the oldest (since 1986) price in this field. More information can be found on:

http://www.icdd.com/resources/awards/birks.htm.

L.S. Birks was the first scientist who (in 1948) has developed an analytical X-ray spectrometer.

This Award consists of a commemorative plaque, detailing the recipient’s scientific achievements

and contributions to the field of X-ray spectrometry (see picture below), and a money price.

The Award is given biennially by the International Center for Diffraction Data during the

Annual Denver Conference on X-Ray Applications.

 

Dr. Tim Elam (University of Washington, USA), chairman of the conference,

presenting the Birks Award in X-Ray Spectrometry to Prof. René Van Grieken

 

He was also appointed as a long-term member of the Scientific Advisory Committee of the

Denver X-Ray Conferences. This conference exists 57 years and he is the first member

from outside the USA.

 

 

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